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1088 12/07/2013 01/31/2015 06/25/2014 2050 login login For Sale

front view Metrology & Inspection For Sale
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JEOL
Model: JWS 8755S CD SEM
Year: 2003

Complete System in good working condition prior to disconnect   Complete System in good working condition prior to disconnect

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Description

JEOL JWS-8755S CD SEM Wafer process inspection system: For Defect Review (DR) Configured for 200 & 300mm wafers Cassette Interface: • x1 300mm FOUP • x1 200mm Open Cassette (Asyst) Resolution: 5nm at 1kV Acc. Voltage: 0.5 to 15kV Tilt: -15deg to 60deg

Shipping from United States (Available: now + 4 weeks lead time ARO). Seller warranty is Operational.

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