Note: This item was SOLD'
The N&K 1700 Series Manual-Load Metrology Systems: JnCo
Broadband spectrometry for film thickness and trench profile measurements on semiconductor wafers.
The n&k 1712 system is designed for handling 200mm and 300mm wafers.
The n&k 1700 system is designed for handling 100mm, 150mm and 200mm wafers.
These systems simultaneously determine thickness, n and k in the spectral range of 190-1000nm, trench profile and provide non-destructive, real time, high throughput measurements directly on the device. These systems encompass advanced pattern recognition software, patented microspot measurement technology and a unique all-reflective optical based system.
The CD series include a polarizer and special trench analysis software.
Shipping from United States (Available: now + 1 week lead time ARO). Seller warranty is Operational.