Listing Created Updated For Sale Sold Inventory Price Minimum Status
1081 03/05/2013 03/05/2013 03/12/2013 2326 login login For Sale

front view Metrology & Inspection For Sale

Model: AIT-XP+
Year: 2001

Installed, Complete System, Operational with demo (no warranty)   Installed, Complete System, Operational with demo (no warranty)

Buy Now
Make Offer (GTC)
Request Quote

AIT-XP plus Dark field wafer inspection system for 200 mm (8”) or 300mm (12”) Dual Open for FIMS Wafer Pre-Aligner Spot sizes 3.5um, 5um and 7um Mixed Mode Detectors with Fixed and Adaptive Mode Core Technology Package HLAT Advanced Detection Algorithm Channel Merge Algorithm Run Time Alignment Run Time Sampled Image Acquisition IADC and RTC Real Time Classification Systems Internal Microscope Review Integrated Optical Microscope (10, 50, 100, 150x) Bright Field / Dark Field Viewing AutoFocus Capability Low Contact Chuck Integrated ULPA Filter Data Transfer, Floppy Disk, CD-RW, Ethernet NFS Communication (TDB) KLARF Output File Off-line Bare Wafer Review (TDB)

Shipping from United States (Available: now + 8 weeks lead time ARO). Seller warranty is Operational.

Q&A Forum:

Please login to ask the seller a question about this equipment listing.

Valid HTML 4.01 Strict