Listing Created Updated For Sale Sold Inventory Price Minimum Status
1040 04/12/2011 01/31/2015 3407 login login Coming

Therma-Wave Metrology & Inspection Coming

Model: OP-5240
Year: 2000

In Storage in good condition (no warranty)   In Storage in good condition (no warranty)

Request Quote

Note: This item was SOLD! Therma-wave Opti-probe OP-5240 film thickness measurement system for 200mm wafers. This advanced system integrates two additional measurement technologies into the Opti-Probe system. As a result, the Opti-Probe 5240 has up to five independent but fully integrated measurement technologies. The two additional technologies integrated into the OP-5240 are spectroscopic ellipsometry and absolute laser ellipsometry, each of which will expand the Opti-Probe's measurement capabilities and improve measurement integrity. Integrates BPR, BPE and DUV Reflectance with Spectroscopic Ellipsometry and Absolute Laser Ellipsometry.

Shipping from United States (Available: now + 1 week lead time ARO). Seller warranty is Operational.

  • This item was SOLD:
Q&A Forum:

Please login to ask the seller a question about this equipment listing.

Q: Question for seller sent on 09 25, 2012.

Valid HTML 4.01 Strict